This new handbook, intended for researchers, engineers and advanced graduate students in all areas of nanoscience, is written by eminent scientists and experts who are pushing the forefront of instrumentation and developing key techniques for the study of atomic structural, optical and electronic properties of nanostructured semiconductor materials. Contents: Volume 1: Electron Microscopies; X-Ray Diffraction Techniques. Volume 2: Scanning Probes; Atom and Optical Probes.