VLSI-SoC: Design for Reliability, Security, and Low Power
23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
IFIP Advances in Information and Communication Technology
Shin, Youngsoo (EDT)
Tsui, Chi Ying (EDT)
Kim, Jae-Joon (EDT)
- 出版社：Springer International Publishing Ag
- 出版年月：2018年 04月
- ISBN：9783319834405
- 装丁：PAP
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装丁について
- 言語：ENG
- 巻数・ページ数：223 p.
- DDC分類：004.6