Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design
A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
Li, Xiaowei
Yan, Guihai
Liu, Cheng
- 出版社：Springer Verlag, Singapore
- 出版年月：2023年 02月
- ISBN：9789811985508
- 装丁：HRD
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装丁について
- 言語：ENG